XRD Diffractometer LXRD-T2010

Introduction

Diffractometer boasts a tube current capacity spanning from 5 to 80 mA with a tube voltage range of 10 to 60 kV. Equipped with a range of X-ray tube options including glass, ceramic, and ripple ceramic tubes. Enhanced with an auto-switching dual wavelength optic. It offers phase identification for unknown samples and phase analysis for known mixed samples. Our system maintains peak performance over time, reducing downtime and ensuring consistent results.

This analytical equipment is designed to meet the rigorous requirements of modern laboratory operations, ensuring high precision, reliability, and ease of use for various experimental applications.

Applications

Diffractometer is used in materials science, chemistry, and mineralogy to characterize and measure crystalline structures, phase composition, crystallite size, and orientation of the sample.

Specifications

X-ray Tube	Glass tube, Ceramic tube, Ripple Ceramic tube
X-Ray Source Material	Cu, Fe, Co, Cr, Mo, etc.,
Focus Size	1 × 10 mm/ 0.4 × 14 mm/ 2 × 12 mm
Stability	≤ 0.01 %
Tube Current	5 to 80 mA
Tube Voltage	10 to 60 kV
Rated Power	3 kW
Goniometer Structure	Horizontal (Ø to 2 Ø )
Radius of Diffraction	185 mm
Scanning Range	0 to 164
Scanning Speed	0.0012º to 70 º min
Maximum Resolving Speed	100 º / min
Scanning Mode	Ø to 2 Ø linkage, Ø, 2 Ø single action; continuous/stepping
Angle Repeatable Accuracy	1 / 1000 º
Minimal Stepping Angle	1 / 1000 º
Detector	Proportional/Scintillation counters
Linearity Count	5 × 105
Energy Resolution	≤ 25 % (PC), ≤ 50 % (SC)
Counting Fashion	Differential Coefficient / integral, automatically, Dead time regulate
Stability of System measure	≤ 0.01 %
Scattered Rays Dose	≤ 1 µ Sv/h
Integrative Stability	≤ 0.5 %
Dimension	1100 × 850 × 1750 mm
Weight	25 kg

Features

Horizontal goniometer structure

Proportional/scintillation counters detector

Temperature-dependent crystal structure analysis

Enables chemical information testing through X-ray diffraction

Programmable operation and integrated design

High throughput with accurate scanning

FAQs

1. What are the specific features of Diffractometer ?

Diffractometer is coupled with an auto-switching dual wavelength optic with a horizontal goniometer structure. For testing unknown samples it has “phase identification” and “phase analysis” for known mixed samples.

2. What is auto-switching dual wavelength optic in Diffractometer ?

An "auto-switching dual wavelength optic" typically refers to a component in an X-ray diffractometer () that automatically allows the instrument to switch between different X-ray wavelengths. This feature is particularly useful in analysis because different wavelengths of X-rays interact differently with materials and can provide complementary information about the sample's crystal structure.

3. What is an Diffractometer?

Diffractometer is a scientific instrument used to analyze the crystalline structure of materials by measuring the diffraction patterns produced when X-rays interact with the atomic structure of a sample.

4. Who invented the ?

The physics scientist “Max Von Laue” invented the X-ray diffraction.

5. What is the application of the Diffractometer?

It is widely used in chemistry, physics, geology, and other fields to identify and characterize crystalline phases, determine crystallography properties and investigate structural changes in materials.

6. What is the objective of Diffractometer?

The objectives of X-ray Diffractometer are Material characterization, Phase identification, Quantitative analysis, Crystallography, Stress and strain analysis, Texture analysis, Phase transformation analysis and Defect analysis.

7. What are the components of Diffractometer?

X-ray tube, sample holder, X-ray detector, collimators, Goniometer, collimators, analyzer crystals, data display and output screens, scintillation counters.