XRD Diffractometer LXRD-T2010

Introduction

Diffractometer offers a scanning speed range from 0.0012° to 50°/min and a 2θ scanning range from -6° to 160°. It is supported by a high-precision diffraction angle measuring system. Its integrated design features a metal-ceramic tube compatible with multiple target materials. This unit comes with a PC or SC, an , and a high-speed 1D semiconductor array detector for fast operation. Our multifunctional diffractometer ensures superior performance and accurate results by combining advanced hardware and software systems. This analytical equipment is designed to meet the rigorous requirements of modern laboratory operations, ensuring high precision, reliability, and ease of use for various experimental applications.

Applications

diffractometer is used to analyze natural or synthetic inorganic or organic materials, widely used in clay minerals, cement building materials, environmental dust, chemical products, drugs, asbestos, rock minerals, polymers, and other research fields.

Specifications

X-Ray Tube	Metal ceramic tube: Cu, Fe, Co, Cr, Mo, etc
Focus Size	1×10 mm, 0.4×14 mm or 2×12 mm
Stability	≤ 0.005%
Tube Power	2.4 kW
Tube Current	5 to 50 mA
Tube Voltage	10 to 60 kV
Rated Power	3 kV (HV, HF control technology)
Goniometer Structure	Sample level (θ to θ)
Diffraction Radius	225 mm
2θ Scanning Range	-6 to 160°
Scanning Speed	0.0012° to 50°/min
Scanning Mode	θs/θd Linkage, Single Action, Continuous Scanning, Stepping, Omega Scanning.
Minimal Stepping Angle	1/10000°
Angle Repeatable Accuracy	1/10000°
Diffraction Angle Accuracy	2θ Angular Linearity
International Standard Sample	Si (Silicon) or Al₂O₃ (Alumina)
Angle Deviation	±0.022°
Angle Locating Speed	1500°/min
Detector	Proportional Counters (PC) Scintillation Counter (SC) Silicon Drift Detector () One-Dimensional Array Detector
Maximum Linear Count Rate	>5×105 cps (PC, SC with the compensate function of miss counting), 15×104 (), 9×102 (1D array)
Energy Resolution Ratio	≤ 25%（PC, one-dimensional array), ≤ 50% (SC), ≤ 200 eV ()
Counting Fashion	Differential coefficient or integral, automatically, dead time regulate
System Measure Stability	≤ 0.01%
Scattered Ray Dose	1uSv/h
01 Box Package Dimension (L×W×H)	1190 × 1020 × 2000 mm
02 Box Package Dimension (L×W×H)	1250 × 1035 × 1050 mm
01 Box Gross Weight	350 kg
02 Box Gross Weight	240 kg
Machine Dimension (L×W×H)	1000 × 800 × 1600 mm
Net Weight	340 kg

Features

Various counting and scanning modes

An X-ray generator control system

High-frequency, high-voltage control technology

Supports programmable operation

Sample level (θ to θ) goniometer structure

Performs multiple tests using functional Accessories

FAQs

1. What are the specifications of the Diffractometer ?

The X-ray tube used in Diffractometer is a metal ceramic tube made up of Cu, Fe, Co, Cr, Mo etc. Its diffraction radius is 225mm. Tube current is 5 to 50 mA and Tube voltage is 10 to 60 kV. It has interlocking and alarm systems.

2. What is the focus size of the Diffractometer ?

Diffractometer has different ranges of focus sizes. They are 1×10 mm, 0.4×14 mm or 2×12 mm.

3. What are the features of the Diffractometer ?

Diffractometer is a multifunctional unit with a perfect combination of hardware and software systems that gives accurate measurement results with a scanning speed of 0.0012° to 50°/min and includes safety features to protect users from radiation exposure.

4. What is an Diffractometer?

Diffractometer is a scientific instrument used to analyze the crystalline structure of materials by measuring the diffraction patterns produced when X-rays interact with the atomic structure of a sample.

5. Who invented the ?

The physics scientist “Max Von Laue” invented the X-ray diffraction.

6. What is the application of the Diffractometer?

It is widely used in chemistry, physics, geology, and other fields to identify and characterize crystalline phases, determine crystallography properties and investigate structural changes in materials.

7. What is the objective of Diffractometer?

The objectives of X-ray Diffractometer are Material characterization, Phase identification, Quantitative analysis, Crystallography, Stress and strain analysis, Texture analysis, Phase transformation analysis and Defect analysis.

8. What are the components of Diffractometer?

X-ray tube, sample holder, X-ray detector, collimators, Goniometer, collimators, analyzer crystals, data display and output screens, scintillation counters.