Introduction
An X-ray diffraction (XRD) diffractometer is an analytical instrument used for the analysis of the crystal structure of the materials by the diffraction of the X-rays, and it is used in the materials, the chemistry, the geology, the pharmaceutical, and the many other applications. The XRD diffractometer directs the X-rays at the sample, and the X-rays are diffracted by the crystal planes, with the diffraction pattern measured and used to identify the phases and the crystal structures; the XRD diffractometer consists of an X-ray source, a sample holder, a goniometer, a detector, and the software, and it provides the diffraction pattern, with features such as the phase identification and the quantitative analysis; the XRD diffractometer is used for the phase identification of the materials, for the analysis of the crystal structures, for the analysis of the powders and the thin films, for the quality control, for the research, and for many other applications, and it is an essential instrument for the crystallography. XRD diffractometers are used in the materials laboratories, in the chemistry laboratories, in the geology, in the pharmaceutical industry, and for many other applications. With their X-ray diffraction, XRD diffractometers are essential for the crystal structure analysis.
XRD Diffractometer LXRD-T2010
Diffractometer offers a wide scanning range of –110° to 161°, ideal for comprehensive material characterization with high precision. It operates at 10 to 60 kV tube voltage, maintain...
XRD Diffractometer LXRD-T2010
Diffractometer boasts a tube current capacity spanning from 5 to 80 mA with a tube voltage range of 10 to 60 kV. Equipped with a range of X-ray tube options including glass, ceramic, an...
XRD Diffractometer LXRD-T2010
Diffractometer offers a scanning speed range from 0.0012° to 50°/min and a 2θ scanning range from -6° to 160°. It is supported by a high-precision diffraction angle measuring system...
Standards
Complies with the above standards, but is not limited to them.
Features
1. X-ray diffraction (XRD) diffractometer for crystal structure and phase analysis.
2. Bragg-Brentano geometry for powder diffraction, phase identification and quantification.
3. Suitable for material science, chemical, pharmaceutical, geological, cement and research.
4. Includes X-ray source, goniometer, detector, sample stage, software and manual.
5. Supports phase identification, crystallinity, crystal structure and residual stress analysis.
FAQ
Q1: What testing scenarios is this XRD mainly applied to?
A: The X-ray diffraction diffractometer is used in materials science, chemical research, pharmaceutical development, geology and mining, cement and building materials, semiconductor, forensic science and research to analyze crystal structure, phase composition, crystallinity, crystal size and residual stress of crystalline materials for material characterization, quality control and research. It supports phase identification of crystalline materials (using PDF databases), quantitative phase analysis (Rietveld refinement), pharmaceutical polymorph identification and quantification, cement and mineral phase analysis, geological mineral identification, semiconductor epitaxial layer analysis, thin film characterization, and residual stress measurement. XRD is the definitive technique for crystalline phase identification and structural analysis.
Q2: What standards does the XRD comply with?
A: The XRD diffractometer follows relevant ISO, ASTM and GB/T standards for X-ray diffraction, including ISO 21464 for phase identification, ASTM E915 for residual stress, and relevant industry standards. The hardware complies with IEC 61010 laboratory safety standards and applicable radiation safety regulations. Calibration should use certified reference materials (e.g., silicon powder, corundum) traceable to international standards. Radiation safety follows applicable regulations. Pharmaceutical applications follow relevant pharmacopoeial methods.
Q3: What is the warranty period for the whole machine and key components?
A: The whole XRD diffractometer is covered by a 12-month warranty. The X-ray source, goniometer, detector, electronics, software and housing are covered, while reference materials, sample holders and fuses are consumables. Damage from improper use or unauthorized repair is excluded. Extended service contracts are standard for this analytical instrument. X-ray tube has a specific service life.
Q4: Is this device difficult to operate? Is professional training required?
A: Operation requires trained analytical personnel familiar with XRD, crystallography, sample preparation and radiation safety. We provide comprehensive training, operation manuals and application support. Proper sample preparation, calibration, method programming, phase identification, Rietveld refinement and radiation safety are important for accurate results and safe operation.
Q5: What is the typical lead-time for order delivery?
A: Standard models require 7-30 working days. In-stock units can ship within 3-7 working days. Custom configurations or large built-to-order systems may require additional time, and we confirm the exact schedule before order confirmation.
Q6: Is regular calibration required? What is the recommended calibration cycle?
A: Calibration with certified reference materials (silicon, corundum) recommended every 6-12 months. Routine verification with a standard sample per batch. X-ray tube and detector performance verified periodically. Goniometer alignment checked. Full system performance verification annually. Radiation safety inspection per regulatory schedule. Software and database updates installed as needed.
Q7: Are supporting consumables universal?
A: Reference materials, sample holders, zero-background plates and X-ray tube are available from laboratory suppliers, though instrument-specific parts should be verified. Long-term consumable cost depends on sample volume and X-ray tube lifespan.
Q8: Can I customize parameters or supporting accessories?
A: Customization includes X-ray source (Cu, Mo, Cr, Co), detector type (1D, 2D, pixel), goniometer configuration, sample stage (reflection, transmission, capillary, high-temperature), SAXS capability, software features and accessories. Additional sample stages and accessories can be ordered separately. Custom orders extend delivery lead-time.
Q9: Does the purchase include on-site installation and commissioning service?
A: Yes, XRD diffractometers include on-site installation, commissioning, calibration, radiation safety verification and operator training by certified specialists. Site preparation guidance is provided before delivery. Vibration isolation and temperature control are important for XRD performance.
Q10: What types of samples are compatible with this equipment?
A: The XRD diffractometer analyzes crystalline solid samples including powders, thin films, bulk solids, fibers and coatings within the sample size, geometry and specification. Amorphous materials produce broad halos rather than sharp peaks. Different sample types require specific holders (zero-background for powders, reflection for bulk, transmission for thin films). Users should prepare flat, representative samples (powders should be finely ground and properly loaded to avoid preferred orientation), select appropriate X-ray wavelength for the sample, use certified reference materials for calibration, account for instrumental broadening, use appropriate databases (PDF-2, PDF-4, ICSD) for phase identification, for quantitative analysis use Rietveld refinement or standard addition methods, follow proper radiation safety procedures, and report results with method parameters specified. The X-ray tube should be warmed up before use. The instrument should be placed on a vibration-isolated table in a temperature-controlled room. Samples should be properly loaded to avoid preferred orientation effects. For thin film analysis, use appropriate geometry (grazing incidence, reflectivity). The detector should be maintained per manufacturer schedule. The instrument should be operated with proper radiation safety interlocks. For pharmaceutical polymorph analysis, follow validated methods and pharmacopoeial requirements.
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