Introduction

Atomic force microscope comes with combined design of scan head and sample stage so as to give strong anti-vibration performance. It’s equipped with precision laser detection and probe alignment device for simple & easy adjustment of laser beam.

This microscope is designed to meet the rigorous requirements of modern laboratory operations, ensuring high precision, reliability, and ease of use for various experimental applications.

Applications

It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.

Specifications

Operation modes Contact mode, friction mode, extended modes of tapping phase, , , scans at random angle
Scan angle Random angle
Maximum scan range X/Y axis: 20 µm, Z axis: 2 µm
Optical system/ Magnification of Magnification: 4x, Resolution: 2.5 µm
Resolution X/Y axis: 0.2 nm, Z axis: 0.05 nm
Sample size Ø≤ 90 mm, H≤ 20 mm
Sample movement 0 to 20 mm
Pulse width of approaching motor 10 ± 2 ms
Scan rate 0.6 Hz to 4.34 Hz
Scanning control XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously
Types of sampling pixel 256×256, 512×512
Feedback type digital feedback
Feedback sampling rate 64 KHz
PC connections: 2.0
Windows software Compatible with windows 98/2000/XP/7/8
Instrument Diemnsion 415 × 410 × 545 mm
Net weight 40 kg
Gross Weight 50 kg

Features

Large range of sample transfer

Modular electronic system for easy maintenance

Adopted with spring for vibration isolation

Provides highly accurate results

Optical observation system for checking tip & sample’s position

2 types of sampling pixel for selection (256×256, 512×512)
Selection of an area of interest for sampling by executing scan area move and cut function
Scans sample in random angle at beginning
Adjustment of laser spot detection system in real time
Selection and setting for different color scanning images in palette
Supports linear average and offset calibration in real time for sample title
Supports scanner sensitivity calibration and electronic controller auto-calibration
Supports offline analysis and process of sample image

FAQs

1. What are the key factors to consider when selecting this microscope for laboratory use?

When selecting this microscope, key factors include: 1) The instrument's precision and accuracy to meet experimental requirements; 2) Compatibility with the types of samples and applications you will be working with; 3) Ease of use and maintenance requirements; 4) Safety features to protect operators and samples; 5) Calibration and certification requirements; 6) Cost-effectiveness and long-term reliability; 7) Technical support and service availability from the supplier. Evaluating these factors ensures that the instrument meets your laboratory's specific needs.

2. How often should this microscope be calibrated to ensure accurate results?

It is recommended to calibrate this microscope at least once every 6-12 months under normal usage conditions. More frequent calibration (every 3-6 months) may be necessary if: 1) The instrument is used continuously for extended periods; 2) It is exposed to harsh environmental conditions (temperature fluctuations, humidity, dust); 3) It is used for critical applications requiring high precision; 4) The instrument has been moved or subjected to physical shock; 5) Calibration checks indicate significant deviations from standard values. Always follow the manufacturer's calibration guidelines.

3. What are the common maintenance procedures required for this microscope?

Common maintenance procedures include: 1) Regular cleaning of the instrument's exterior and sample contact surfaces to prevent contamination and ensure proper operation; 2) Inspection of moving parts (if applicable) for wear and lubrication as recommended by the manufacturer; 3) Replacement of consumable parts (filters, bulbs, reagents) according to usage guidelines; 4) Verification of performance parameters (temperature, pressure, voltage) regularly; 5) Storage of the instrument in a clean, dry environment when not in use; 6) Keeping a maintenance log to track service activities and identify potential issues early; 7) Following the manufacturer's specific maintenance schedule for optimal performance and longevity.

4. Can this microscope be used with different types of samples, and are there any compatibility considerations?

Yes, this microscope can be used with a variety of sample types, but compatibility considerations are important: 1) Check if the instrument's materials are compatible with the chemical composition of your samples (avoid corrosive or reactive substances that may damage the instrument); 2) Ensure that the sample volume and concentration are within the instrument's recommended range; 3) For biological samples, consider sterility requirements and potential cross-contamination risks; 4) For volatile or hazardous samples, ensure proper ventilation and safety precautions are in place; 5) Consult the manufacturer's documentation for specific sample compatibility guidelines, and perform compatibility tests with new sample types before regular use.

5. What should be done if the microscope malfunctions or produces inconsistent results?

If malfunctions or inconsistent results occur: 1) First, check the instrument's user manual for troubleshooting guidelines specific to the issue; 2) Verify that the instrument is properly calibrated and within its calibration period; 3) Inspect for obvious issues such as loose connections, damaged parts, or incorrect settings; 4) Clean the instrument thoroughly to remove any contamination that may affect results; 5) Repeat the experiment with a known standard sample to determine if the issue is with the instrument or the sample; 6) If the problem persists, discontinue use of the instrument to prevent further damage or inaccurate results; 7) Contact technical support or a qualified service technician for diagnosis and repair, providing details of the issue and any troubleshooting steps already performed.

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