Introduction
An atomic force microscope (AFM) is a high-resolution microscope used for the imaging and the measurement of the surfaces at the nanometer scale, by the scanning of the surface with a sharp probe, and it is used in the materials, the nanoscience, the biology, the physics, and the many other applications. The atomic force microscope consists of a cantilever with a sharp tip, a scanning stage, a laser and a photodetector for the detection of the deflection of the cantilever, a feedback control system, and the software, and it scans the surface with the tip, with the interactions between the tip and the surface measured, providing the topographical images and the surface properties, such as the roughness and the adhesion, at the nanometer resolution; the atomic force microscope is used for the imaging of the surfaces, for the measurement of the surface roughness, for the analysis of the nanomaterials, for the imaging of the biological samples, for the measurement of the mechanical properties, and for many other applications; the atomic force microscope is an essential instrument for the nanoscale characterization. Atomic force microscopes are used in the materials laboratories, in the nanoscience, in the biology laboratories, in the physics, in the research, and for many other applications. With their nanoscale resolution, atomic force microscopes are essential for the surface characterization.
Atomic force microscope LAFM-T2010
Atomic force microscope comes with combined design of scan head and sample stage so as to give strong anti-vibration performance. It’s equipped with precision laser detection and probe ...
Atomic force microscope LAFM-T2011
Atomic force microscope comes with combined design of scan head and sample stage, to give strong anti-vibration performance. Adopted with servomotor, drives the sample approaching tip ma...
Standards
ISO 9345:2019-Microscopes-Interfacing dimensions for imaging components
Complies with the above standards, but is not limited to them.
Features
1. Atomic force microscope for nanoscale surface imaging and property measurement.
2. High-resolution scanning probe with multiple imaging modes including contact, tapping and phase.
3. Suitable for materials science, nanotechnology, biology, semiconductor and surface science research.
4. Measures topography, roughness, mechanical properties and electrical characteristics at nanoscale.
5. Includes scanner, probe holder, vibration isolation, control electronics and analysis software.
FAQ
Q1: What testing scenarios is this microscope mainly applied to?
A: The atomic force microscope is used in materials science, nanotechnology, biological research, semiconductor manufacturing, polymer science and surface science laboratories to image and characterize surfaces at the nanometer scale. It supports surface topography imaging, roughness measurement, thin film characterization, nanoparticle sizing, biological cell and molecule imaging, semiconductor surface inspection, polymer morphology study and mechanical property mapping including hardness and elasticity. The AFM provides three-dimensional surface images with sub-nanometer vertical resolution without requiring conductive samples or vacuum environment, unlike electron microscopy. It is essential for nanotechnology research, materials development, quality control and academic research requiring nanoscale surface characterization, where detailed understanding of surface structure, morphology and properties at the nanometer level is critical for material development, device fabrication and scientific discovery.
Q2: What standards does the microscope comply with?
A: The AFM supports surface characterization referenced in ISO 25178 for surface texture, ASTM E2859 for atomic force microscopy dimensional measurement, and relevant GB/T standards for nanoscale characterization. The instrument complies with relevant laboratory electrical safety standards. Calibration should use certified reference gratings and step-height standards traceable to international standards.
Q3: What is the warranty period for the whole machine and key components?
A: The whole AFM system is covered by a 12-month warranty. The scanner, control electronics, optical system and software are covered, while probes, cantilevers and calibration standards are consumables excluded from warranty. Damage from improper probe handling, scanner crash or unauthorized repair is excluded. Extended service contracts are strongly recommended for this high-value instrument.
Q4: Is this device difficult to operate? Is professional training required?
A: AFM operation requires specialist training in probe microscopy, sample preparation and image analysis. We provide comprehensive training, operation manuals and application support. Proper probe selection, cantilever tuning, scan parameter optimization and image interpretation are essential for quality results.
Q5: What is the typical lead-time for order delivery?
A: Standard models require 7-30 working days. In-stock units can ship within 3-7 working days. Custom configurations or large built-to-order systems may require additional time, and we confirm the exact schedule before order confirmation.
Q6: Is regular calibration required? What is the recommended calibration cycle?
A: Scanner calibration with certified reference standards is recommended every 3-6 months. Probe and cantilever should be inspected and replaced as needed. Laser alignment checked periodically. Full system performance verification annually. Environmental conditions including vibration and acoustic noise should be monitored regularly.
Q7: Are supporting consumables universal?
A: AFM probes and cantilevers are available from multiple suppliers, though compatibility with the probe holder should be verified. Calibration standards are specialized. Long-term consumable cost is moderate, with probes being the main recurring item.
Q8: Can I customize parameters or supporting accessories?
A: Customization includes scanner range, imaging modes, environmental control, sample stage and software modules. Custom orders require detailed application specification and extend lead-time. Users should define sample types, required resolution, imaging modes and environmental conditions before configuration.
Q9: Does the purchase include on-site installation and commissioning service?
A: Yes, AFM systems include on-site installation, commissioning, calibration and comprehensive operator training by certified application specialists. Site preparation guidance is provided before delivery to ensure vibration isolation, acoustic control, power and environmental requirements are met.
Q10: What types of samples are compatible with this equipment?
A: The AFM images solid surfaces including metals, ceramics, polymers, semiconductors, biological samples and thin films within the scanner range and sample size. Very rough or tall samples may exceed scanner range. Soft biological samples require careful imaging parameters to avoid damage. Samples should be flat, clean and firmly mounted. Users should select appropriate probe type and imaging mode for each sample, ensure proper cantilever tuning, minimize vibration and acoustic noise, and follow calibration procedures to maintain measurement accuracy and traceability for nanoscale characterization.
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